Glass characterization with XPS and ToF-SIMS techniques
Glass characterization with XPS and ToF-SIMS techniques
Laurent DUPUY*, Julien AMALRIC, Céline BRUNON
SERMA TECHNOLOGIES, 64 chemin des Mouilles 69130 ECULLY, FRANCE
At SERMA TECHNOLOGIES we provide analysis service for academics and industrial companies.
Through examples we will demonstrate the interest of XPS and ToF-SIMS techniques to study glass alteration, glass treatments and glass defects.